[1] Grice J. D., Burns P. C., Hawthorne F. C., et al., Can. Mineral, 1999, 37, 731
[2] Millini R., Perego G., Bellussi G., Top. Catal., 1999, 9, 13
[3] Becker P., Adv. Mater., 1998, 10, 979
[4] Touboul M., Penin N., Nowogrocki G., Solid State Science, 2003, 5, 1327(and references therein)
[5] Chen C. T., Wang Y. B., Wu B. C., et al., Nature, 1995, 373, 322
[6] Yu Z. T., Shi Z., et al., J. Chem. Soc., Dalton Trans., 2000, 2031
[7] Huppertz H., von der Eltz B., J. Am. Chem. Soc., 2002, 124, 9376
[8] Lu P. C., Wang Y. X., et al., Chem. Commun., 2001, 1178
[9] Schubert D. M., Alam F., et al., Chem. Mater., 2003, 15, 866
[10] He Y., Chen W., Yang J., et al., Chem. Res. Chinese Universities, 2006, 22(3), 271
[11] Schubert D. M., Visi M. Z., et al., Inorg. Chem., 2000, 39, 2250
[12] Visi M. Z., Knobler C. B., et al., Cryst. Growth Des., 2006, 6, 538
[13] Liu Z. H, Li L. Q., Zhang W. J., Inorg. Chem., 2006, 45, 1430
[14] Cao G. J., Sun Y. Q., Zheng S. T., et al., Chinese J. Struct. Chem., 2009, 28, 525
[15] Li M., Chang J. Z., et al., J. Solid State Chem., 2006, 179, 3265
[16] Yang S. H., Li G. B., et al., J. Solid State Chem., 2007, 180, 2225
[17] Schubert D. M., Visi M. Z., et al., Inorg. Chem., 2008, 47, 4740
[18] SMART and SAINT(Software Packages), Siemens Analytical X-ray Instruments, Inc., Madison, WI, 1996
[19] SHELXL Program, Version 5.1, Siemens Industrial Automation, Inc., 1997
[20] Li L. Y., Li G. B., et al., Acta Crystallogr. Section C: Crystal Structure Communications, Part 11, 2003, 59, I 115
[21] Christ C. L., Clark J. R., Phys. Chem. Miner., 1977, 2, 59
[22] Heller G., Top. Curr. Chem., 1986, 131, 39 |