Chemical Research in Chinese Universities ›› 2020, Vol. 36 ›› Issue (4): 703-708.doi: 10.1007/s40242-020-0177-0

• Articles • Previous Articles     Next Articles

Electrically Stimulated Band Alignment Transit in Black Phosphorus/ β-Ga2O3 Heterostructure Dual-band Photodetector

LI Chang1,2, XIE Liu2,3, HE Tao4, ZHANG Yan2,3, DONG Zhuo2,3, YANG Zeyuan1,2, ZHANG Xiaodong4, WANG Zhongchang5, ZHANG Kai2   

  1. 1. Nano Science and Technology Institute, University of Science and Technology of China, Suzhou 215123, P. R. China;
    2. i-Lab, Suzhou Institute of Nano-Tech and Nano-Bionics(SINANO), Chinese Academy of Sciences, Suzhou 215123, P. R. China;
    3. School of Nano Technology and Nano Bionics, University of Science and Technology of China, Hefei 230026, P. R. China;
    4. CAS Key Laboratory of Nanodevices and Applications, Suzhou Institute of Nano-Tech and Nano-Bionics(SINANO), Chinese Academy of Sciences, Suzhou 215123, P. R. China 5. International Iberian Nanotechnology Laboratory(INL), Avenida Mestre José Veiga s/n, Braga 4715-330, Portugal
  • Received:2020-06-10 Revised:2020-07-07 Online:2020-08-01 Published:2020-07-30
  • Contact: ZHANG Kai E-mail:kzhang2015@sinano.ac.cn
  • Supported by:
    Supported by the National Natural Science Foundation of China(Nos.61922082, 61875223, 61927813), the Natural Science Foundation of Jiangsu Province, China(No.BK20191195) and the National Key R&D Program of China(No.2016YFE0105700).

Abstract: In recent decades, dual-band photodetectors have received widespread attention due to better target identification, which are considered as the development trend of next generation photodetectors. However, the traditional dual-band photodetectors based on heteroepitaxial growth, superlattice and multiple quantum well structures are limited by complex fabrication process and low integration. Herein, we report a UV/IR dual-band photodetector by integrating ultra-wide gap β-Ga2O3 and narrow-gap black phosphorous(BP) nanoflakes. A vertical van der Waals (vdW) heterostructure is formed between BP and β-Ga2O3 by mechanically exfoliated method integrated without the requirement of lattice match. The heterostructure devices show excellent rectification characteristics with high rectifying ratio of ca. 106 and low reverse current around pA. Moreover, the device displays obvious photoresponse under UV and IR irradiations with responsivities of 0.87 and 2.15 mA/W, respectively. We also explore the band alignment transit within the heterostructure photodetector at different bias voltages. This work paves the way for fabricating novel dual-band photodetectors by utilizing 2D materials.

Key words: Black phosphorous, β-Gallium oxide, van der Waals heterostructure, Dual-band photodetector