Chemical Research in Chinese Universities ›› 2015, Vol. 31 ›› Issue (4): 585-589.doi: 10.1007/s40242-015-5016-3

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Novel One-component Positive-tone Chemically Amplified I-Line Molecular Glass Photoresist Based on Tannic Acid

WEI Qi, WANG Liyuan   

  1. Beijing Key Laboratory of Energy Conversion and Storage Materials, College of Chemistry, Beijing Normal University, Beijing 100875, P. R. China
  • Received:2015-01-12 Revised:2015-05-25 Online:2015-08-01 Published:2015-06-29
  • Contact: WANG Liyuan E-mail:wly@bnu.edu.cn
  • Supported by:

    Supported by the National Basic Research Program of China(No.2013CBA01703) and the National Science and Technology Major Projects of China(No.2010ZX02303).

Abstract:

Molecular glass resist has been considered as one of the best choices for a new generation of lithography. In this work, a new type of photoactive compound was obtained by the esterification of tannic acid with 2-diazo-1- naphthoquinone-4-sulfonyl chloride(2,1,4-DNQ-Cl) and ditertbutyl dicarbonate. The new obtained compound possessed both a photosensitive group of diazonaphthoquinone sulfonate(2,1,4-DNQ) and a group of acidolytic protection. Upon the irradiation of the compound under 365 nm light, the former group was photolyzed and converted into indene carboxylic acid along with a small amount of sulfonic acid, which could lead to the deprotection of the latter group. As a result, a novel i-line molecular glass photoresist was formed with the chemical modification of tannic acid. The experimental results show that the modificated compound had a fair solubility in many organic solvents. The lithographic performance of the resist was evaluated on an i-line exposure system with high photosensitivity and resolution as well.

Key words: Tannic acid, 2,1,4-Diazonaphthoquinone(DNQ) sulfonate, I-Line resist, Chemically amplified