Chemical-sensitive Electron Tomography for Nanomaterials

doi:10.1007/s40242-025-4239-1

高等学校化学研究 ›› 2025, Vol. 41 ›› Issue (2): 222-236.doi: 10.1007/s40242-025-4239-1

Chemical-sensitive Electron Tomography for Nanomaterials

LIU Liangwei^1,3, FENG Shiqiang^1,2, HAN Lili¹

1. State Key Laboratory of Structural Chemistry, Fujian Institute of Research on the Structure of Matter, Chinese Academy of Sciences, Fuzhou 350002, P. R. China;
2. Fujian Science & Technology Innovation Laboratory for Optoelectronic Information of China, Fuzhou 350108, P. R. China;
3. University of Chinese Academy of Sciences, Beijing 101408, P. R. China

收稿日期:2024-12-13 接受日期:2025-02-20 出版日期:2025-04-01 发布日期:2025-03-31
通讯作者: HAN Lili,llhan@fjirsm.ac.cn E-mail:llhan@fjirsm.ac.cn
基金资助:
This work was supported by the National Key Research and Development Program of China (No. 2022YFA1505700), the National Natural Science Foundation of China (Nos. 22475214, 22205232), the Talent Plan of Shanghai Branch, Chinese Academy of Sciences (No. CASSHB-QNPD-2023-020), the Natural Science Foundation of Fujian Province, China (No. 2023J06044), and the Self-deployment Project Research Program of Haixi Institutes, Chinese Academy of Sciences (Nos. CXZX-2022-JQ06, CXZX-2022-GH03).

Chemical-sensitive Electron Tomography for Nanomaterials

LIU Liangwei^1,3, FENG Shiqiang^1,2, HAN Lili¹

1. State Key Laboratory of Structural Chemistry, Fujian Institute of Research on the Structure of Matter, Chinese Academy of Sciences, Fuzhou 350002, P. R. China;
2. Fujian Science & Technology Innovation Laboratory for Optoelectronic Information of China, Fuzhou 350108, P. R. China;
3. University of Chinese Academy of Sciences, Beijing 101408, P. R. China

Received:2024-12-13 Accepted:2025-02-20 Online:2025-04-01 Published:2025-03-31
Contact: HAN Lili,llhan@fjirsm.ac.cn E-mail:llhan@fjirsm.ac.cn
Supported by:
This work was supported by the National Key Research and Development Program of China (No. 2022YFA1505700), the National Natural Science Foundation of China (Nos. 22475214, 22205232), the Talent Plan of Shanghai Branch, Chinese Academy of Sciences (No. CASSHB-QNPD-2023-020), the Natural Science Foundation of Fujian Province, China (No. 2023J06044), and the Self-deployment Project Research Program of Haixi Institutes, Chinese Academy of Sciences (Nos. CXZX-2022-JQ06, CXZX-2022-GH03).

摘要/Abstract

摘要： Nanomaterials have greatly received interest in various fields due to their excellent activity, typically attributed to their nanoscale physical and chemical properties. Transmission electron microscopy (TEM) as a powerful tool for characterizing nanomaterials can offer microscopic information with high spatial resolution. However, TEM faces challenges in obtaining information along the electron beam direction (Z direction), which limits its ability to explore the unique characteristics of nanomaterials on a three-dimensional (3D) scale. Electron tomography (ET) is an advanced imaging technique that allows for the visualization of 3D structures of nanomaterials. When combined with energy-dispersive X-ray spectroscopy (EDS) or electron energy loss spectroscopy (EELS), it enables researchers to reveal chemical changes in three dimensions, enhancing the understanding of the complex mechanisms underlying changes in chemical properties. This review summarizes and discusses the recent advancements in EDS/EELS (chemical-sensitive) ET imaging techniques, including the traditional reconstruction method, deep learning-based method, and multi-modal method, which provide detailed processes of reconstruction to facilitate the understanding of how they work for related researchers. Moreover, several successful applications are presented to show the capabilities of chemical-sensitive ET in diverse fields. Finally, the existing challenges and solutions are discussed to propel the development of ET imaging techniques.

关键词: Nanomaterial, Electron tomography, Three dimension (3D), Energy-dispersive X-ray spectroscopy (EDS), Electron energy loss spectroscopy

Abstract: Nanomaterials have greatly received interest in various fields due to their excellent activity, typically attributed to their nanoscale physical and chemical properties. Transmission electron microscopy (TEM) as a powerful tool for characterizing nanomaterials can offer microscopic information with high spatial resolution. However, TEM faces challenges in obtaining information along the electron beam direction (Z direction), which limits its ability to explore the unique characteristics of nanomaterials on a three-dimensional (3D) scale. Electron tomography (ET) is an advanced imaging technique that allows for the visualization of 3D structures of nanomaterials. When combined with energy-dispersive X-ray spectroscopy (EDS) or electron energy loss spectroscopy (EELS), it enables researchers to reveal chemical changes in three dimensions, enhancing the understanding of the complex mechanisms underlying changes in chemical properties. This review summarizes and discusses the recent advancements in EDS/EELS (chemical-sensitive) ET imaging techniques, including the traditional reconstruction method, deep learning-based method, and multi-modal method, which provide detailed processes of reconstruction to facilitate the understanding of how they work for related researchers. Moreover, several successful applications are presented to show the capabilities of chemical-sensitive ET in diverse fields. Finally, the existing challenges and solutions are discussed to propel the development of ET imaging techniques.

Key words: Nanomaterial, Electron tomography, Three dimension (3D), Energy-dispersive X-ray spectroscopy (EDS), Electron energy loss spectroscopy

LIU Liangwei, FENG Shiqiang, HAN Lili. Chemical-sensitive Electron Tomography for Nanomaterials[J]. 高等学校化学研究, 2025, 41(2): 222-236.

LIU Liangwei, FENG Shiqiang, HAN Lili. Chemical-sensitive Electron Tomography for Nanomaterials[J]. Chemical Research in Chinese Universities, 2025, 41(2): 222-236.

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