X-ray Multiple Diffraction Topographic Imaging Technique For Growth History Study of Habit Modifying Impurity Doped Crystals
LAI X., MA C., K. J. Robert, M. C. Miller
X-ray Multiple Diffraction Topographic Imaging Technique For Growth History Study of Habit Modifying Impurity Doped Crystals
LAI X., MA C., K. J. Robert, M. C. Miller
高等学校化学研究 . 2004, (4): 411 -416 .