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高等学校化学研究 ›› 2025, Vol. 41 ›› Issue (2): 343-350.doi: 10.1007/s40242-025-4247-1

• Articles • 上一篇    下一篇

Enhanced Bragg Filter: A New Drift Correction Method for Low-dose High-resolution STEM Images

WANG Yujiao, ZHOU Jinfei, LIU Dong, LIU Lingmei, LI Xiao, ZHANG Daliang   

  1. Institute of Advanced Interdisciplinary Studies & School of Chemistry and Chemical Engineering, Chongqing University, Chongqing 400044, P. R. China
  • 收稿日期:2024-12-20 接受日期:2025-01-17 出版日期:2025-04-01 发布日期:2025-03-31
  • 通讯作者: LI Xiao,lixiao@cqu.edu.cn;ZHANG Daliang,daliang.zhang@cqu.edu.cn E-mail:lixiao@cqu.edu.cn;daliang.zhang@cqu.edu.cn
  • 基金资助:
    This work was supported by the National Key Research and Development Program of China (No. 2022YFE0113800) and the National Natural Science Foundation of China (No. 22309021).

Enhanced Bragg Filter: A New Drift Correction Method for Low-dose High-resolution STEM Images

WANG Yujiao, ZHOU Jinfei, LIU Dong, LIU Lingmei, LI Xiao, ZHANG Daliang   

  1. Institute of Advanced Interdisciplinary Studies & School of Chemistry and Chemical Engineering, Chongqing University, Chongqing 400044, P. R. China
  • Received:2024-12-20 Accepted:2025-01-17 Online:2025-04-01 Published:2025-03-31
  • Contact: LI Xiao,lixiao@cqu.edu.cn;ZHANG Daliang,daliang.zhang@cqu.edu.cn E-mail:lixiao@cqu.edu.cn;daliang.zhang@cqu.edu.cn
  • Supported by:
    This work was supported by the National Key Research and Development Program of China (No. 2022YFE0113800) and the National Natural Science Foundation of China (No. 22309021).

摘要: High-angle annular dark-field scanning TEM (HAADF-STEM) images play a critical role in the structural characterization of chemical materials. However, drift correction is a critical challenge in imaging beam-sensitive materials, where sample motion and signal-to-noise ratio (SNR) hinder high-resolution image reconstruction. In this study, we propose an enhanced Bragg filter (EBF) method for robust drift correction and high-resolution reconstruction of HAADF-STEM images. The EBF method involves the semi-manual selection of reflection spots to extract periodic lattice features, which significantly enhance the SNR and preserve periodicity in low-dose images. We demonstrate the superior performance of the method by comparing it with conventional low-pass and band-pass filters. The effectiveness of the EBF method is validated on ZSM-5 zeolite crystals, achieving a spatial resolution of 1.25 Å (1 Å=0.1 nm) and enabling precise tracking of structural evolution under electron beam exposure. Furthermore, we apply the EBF method for super-resolution imaging of ZSM-5 at low magnification, enriching structural details without compromising the field of view. This study presents a robust solution for imaging beam-sensitive materials and advancing low-dose electron microscopy techniques.

关键词: STEM image series, Drift correction, Enhanced Bragg filter, Beam-sensitive material, Super-resolution

Abstract: High-angle annular dark-field scanning TEM (HAADF-STEM) images play a critical role in the structural characterization of chemical materials. However, drift correction is a critical challenge in imaging beam-sensitive materials, where sample motion and signal-to-noise ratio (SNR) hinder high-resolution image reconstruction. In this study, we propose an enhanced Bragg filter (EBF) method for robust drift correction and high-resolution reconstruction of HAADF-STEM images. The EBF method involves the semi-manual selection of reflection spots to extract periodic lattice features, which significantly enhance the SNR and preserve periodicity in low-dose images. We demonstrate the superior performance of the method by comparing it with conventional low-pass and band-pass filters. The effectiveness of the EBF method is validated on ZSM-5 zeolite crystals, achieving a spatial resolution of 1.25 Å (1 Å=0.1 nm) and enabling precise tracking of structural evolution under electron beam exposure. Furthermore, we apply the EBF method for super-resolution imaging of ZSM-5 at low magnification, enriching structural details without compromising the field of view. This study presents a robust solution for imaging beam-sensitive materials and advancing low-dose electron microscopy techniques.

Key words: STEM image series, Drift correction, Enhanced Bragg filter, Beam-sensitive material, Super-resolution